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SPAR 2010

February 3, 2010by RIEGL Leave a comment

Will you be there? Stop by and visit Riegl USA at booth 1. Starting at noon on Sunday, February 7th the latest Riegl innovation, the VMX-250 mobile scanning system, will […]

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Countdown to ASPRS/Mapps

November 2, 2009by RIEGL Leave a comment

We are preparing for our upcoming visit to San Antonio, Texas for the ASPRS/MAPPS 2009 Fall Conference.  ” MAPPS and ASPRS are once again organizing a dynamic conference around a […]

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Visit us at InterGeo

September 22, 2009by RIEGL Leave a comment

This week Riegl USA President Jim van Rens and Riegl USA CTO Ted Knaak, will be in Karlsruhe, Germany attending InterGeo with Riegl Laser Measurement Systems of Austria. Visit the […]

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Riegl USA Scanner Operation and Post Processing Training

July 13, 2009by RIEGL Leave a comment

Riegl USA offers in-depth training sessions for companies looking to learn how to get the most of their new scanner or just wanting to use their old scanner for a […]

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Riegl USA Announces Organizational Changes

May 6, 2009by RIEGL Leave a comment

Riegl USA recently announced a number of organizational changes.  Ted Knaak is now Chief Technical Officer of Riegl USA.  This new position will allow Mr. Knaak to use his enormous […]

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Riegl USA…on the road again

April 20, 2009by RIEGL Leave a comment

 Last week, Riegl USA exhibited at the SPIE Defense, Security and Sensing Conference. Riegl USA was one of 500 exhibitors! The conference held over 2,000 technical presentation and over 6,000 […]

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Latest News About Riegl’s VZ-400

April 9, 2009by RIEGL Leave a comment

The month of March brought more great news about the VZ-400’scapabilities.  A report released late last month gives an overview of the excellent results acquired with the new RIEGL VZ-400 […]

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Great Data: What does full waveform have to do with it?

April 8, 2009by RIEGL 2 Comments

By: Laura Diaz- Riegl USA Marketing Manager The topic of full waveform analysis and online waveform analysis is a prevalent one when it comes to Riegl’s work. Not having come […]

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Riegl Celebrates the 75th anniversary of ASPRS

March 23, 2009by RIEGL Leave a comment

In 1934, a group of men led by Col. Claude Birdseye met in Washington D.B. to discuss forming a photogrammetric society in the United States. The society evolved and in […]

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Riegl’s Advanced Field System Featured in POB Eblast

March 19, 2009by RIEGL Leave a comment

The Riegl field system has successfully advanced the quality of data, reduced data collection and post-processing time, and improved the overall efficiency of field operations. The Mississippi Department of Transportation […]

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  • One day away from the next #RIEGL #UltimateLiDAR webinar! Join us on Thursday, Jan. 26th from 2:00-2:40PM (EST) fo… twitter.com/i/web/status/1… 1 week ago
  • One day away from the next #RIEGL #UltimateLiDAR webinar! Join us on Wednesday, Jan. 25th from 2:00-3:00PM (EST) f… twitter.com/i/web/status/1… 1 week ago
  • We are one week away from the next #RIEGL #UltimateLiDAR webinar! Join us on Thursday, Jan. 26th from 2:00-2:40PM… twitter.com/i/web/status/1… 2 weeks ago
  • #RIEGL will be at #GEOWeek2023 in Denver, CO Feb. 13-15th at the Colorado Convention Center at Booth 607! We are e… twitter.com/i/web/status/1… 2 weeks ago
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